DIELECTRIC-PROPERTIES OF BATIO3 SRTIO3 MULTILAYERED THIN-FILMS PREPARED BY PULSED-LASER DEPOSITION/

Citation
Bd. Qu et al., DIELECTRIC-PROPERTIES OF BATIO3 SRTIO3 MULTILAYERED THIN-FILMS PREPARED BY PULSED-LASER DEPOSITION/, Applied physics letters, 72(11), 1998, pp. 1394-1396
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
11
Year of publication
1998
Pages
1394 - 1396
Database
ISI
SICI code
0003-6951(1998)72:11<1394:DOBSMT>2.0.ZU;2-4
Abstract
BaTiO3/SrTiO3 multilayered thin films were deposited on Si and Pt/Si s ubstrates. X-ray diffraction clearly shows the formation of the supers tructures. Phase transition properties were studied via dielectric mea surements. Glassy behavior, characterized by a strong frequency disper sion of dielectric properties, was found in samples with a total thick ness of 400 nm, while in samples with a total thickness of 800 nm, nor mal ferroelectric phase transitions with two dielectric peaks were obs erved. A preliminary interpretation assumes that size effects which fr ustrate long range ferroelectric ordering may lead to the relaxational behavior in BaTiO3/SrTiO3 superstructures. (C) 1998 American Institut e of Physics.