BaTiO3/SrTiO3 multilayered thin films were deposited on Si and Pt/Si s
ubstrates. X-ray diffraction clearly shows the formation of the supers
tructures. Phase transition properties were studied via dielectric mea
surements. Glassy behavior, characterized by a strong frequency disper
sion of dielectric properties, was found in samples with a total thick
ness of 400 nm, while in samples with a total thickness of 800 nm, nor
mal ferroelectric phase transitions with two dielectric peaks were obs
erved. A preliminary interpretation assumes that size effects which fr
ustrate long range ferroelectric ordering may lead to the relaxational
behavior in BaTiO3/SrTiO3 superstructures. (C) 1998 American Institut
e of Physics.