HIGH-RESOLUTION REFLECTIVITY DIFFRACTOMETER ON STATION 2.3 (DARESBURYLABORATORY)

A high resolution reflectivity diffractometer (HRRD) has been recently commissioned on Station 2.3 at the SRS, Daresbury Laboratory. Using t he instrument which is x-ray wavelength tunable, the characterization of the interface structure in an ion-assisted deposited Co/Cu multilay er has been carried out, In order to improve the electron density cont rast of the sample, we have used an x-ray energy near the Cu K edge of 8.989 keV. By scanning the normal (specular), near normal (off specul ar), and parallel axes (transverse) elf the surface, we have obtained useful reflectivity intensity data. By applying simulations to the dat a, we have determined a total roughness (rms) of 6.0 +/- 0.5 Angstrom with a significant contribution from correlated interfacial roughness (4.2 +/- 0.2. Angstrom). Other detailed structural information obtaine d has successfully demonstrated that the commissioned instrument is a viable tool for reflectivity studies. (C) 1998 American Institute of P hysics. [S0034-6748(98)02203-5].