DIRECT MEASUREMENT OF REFRACTIVE-INDEX DISPERSION USING A TIME-DELAYED TECHNIQUE

We describe a new way to measure the refractive index of dielectric ma terials using a time-resolved correlation method. By measuring the tim e delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared s pectral regime. (C) 1998 American Institute of Physics.