STRUCTURE DETECTION IN LOW-INTENSITY X-RAY IMAGES

In the context of assessing and characterizing structures in X-ray ima ges, we compare different approaches. Most often the intensity level i s very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the mos t reliable one. We also present a multiresolution filtering method bas ed on the wavelet coefficients detection. Comparative results are pres ented by means of a simulated cluster of galaxies.