INTERROGATION OF NANOSCALE SILICON DIOXIDE WATER INTERFACES VIA HYPER-RAYLEIGH SCATTERING

Citation
Fw. Vance et al., INTERROGATION OF NANOSCALE SILICON DIOXIDE WATER INTERFACES VIA HYPER-RAYLEIGH SCATTERING, JOURNAL OF PHYSICAL CHEMISTRY B, 102(11), 1998, pp. 1845-1848
Citations number
28
Categorie Soggetti
Chemistry Physical
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
102
Issue
11
Year of publication
1998
Pages
1845 - 1848
Database
ISI
SICI code
1089-5647(1998)102:11<1845:IONSDW>2.0.ZU;2-0
Abstract
Hyper-Rayleigh scattering (HRS) experiments performed on nanometer-sca le SiO2/water interfaces (aqueous colloidal suspensions) display finit e, measurable signals. HRS is not constrained by the orientational, si ze, and/or charge restrictions inherent to conventional interfacial se cond harmonic generation (SHG) or electric-field-induced SHG measureme nts. Thus, apparently for the first time, the second-order nonlinear o ptical (NLO) response of ultrasmall interfaces has been measured. pH- and electrolyte-dependent experiments show the response to be sensitiv e to changes in chemical composition at the silicon dioxide/solution i nterface. HRS provides detailed information about the surface of these technologically interesting and important particles in their native s olution-phase environment.