FRACTAL CHARACTERISTICS OF SURFACE-MORPHOLOGY FOR HYDROGENATED SILICON FILMS

Authors
HE YL WAN MF YUAN KH RONG AL WEI XW
Citation
Yl. He et al., FRACTAL CHARACTERISTICS OF SURFACE-MORPHOLOGY FOR HYDROGENATED SILICON FILMS, Chinese Science Bulletin, 41(19), 1996, pp. 1659-1665
Citations number
9
Categorie Soggetti
Multidisciplinary Sciences
Journal title
Chinese Science Bulletin → ACNP
ISSN journal
10016538
Volume
41
Issue
19
Year of publication
1996
Pages
1659 - 1665
Database
ISI
SICI code
1001-6538(1996)41:19<1659:FCOSFH>2.0.ZU;2-Z