SENSITIVITY-ENHANCED REFLECTION Z-SCAN BY OBLIQUE-INCIDENCE OF A POLARIZED BEAM

Authors
MARTINELLI M BIAN S LEITE JR HOROWICZ RJ
Citation
M. Martinelli et al., SENSITIVITY-ENHANCED REFLECTION Z-SCAN BY OBLIQUE-INCIDENCE OF A POLARIZED BEAM, Applied physics letters, 72(12), 1998, pp. 1427-1429
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
72
Issue
12
Year of publication
1998
Pages
1427 - 1429
Database
ISI
SICI code
0003-6951(1998)72:12<1427:SRZBOO>2.0.ZU;2-Y
Abstract
We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivit y. In this technique the reflection from a polarized Gaussian laser be am close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optic al crystal, and higher values are possible to be obtained. (C) 1998 Am erican Institute of Physics.