MEASUREMENT OF THE STATIC ERROR RATE OF A STORAGE CELL FOR SINGLE MAGNETIC-FLUX QUANTA, FABRICATED FROM HIGH-T-C MULTILAYER BICRYSTAL JOSEPHSON-JUNCTIONS

We measured the static error rate of a high-T-c superconductor de supe rconducting quantum interference device (SQUID), which, in the form as a storage loop for single flux quanta, is a basic element of rapid si ngle flux quantum circuits. Using high-T-c multilayer bicrystal techno logy, we fabricated a stacked de SQUID pair, one SQUID serving as the storage loop, the other one as the readout device. The escape rate of a stored flux quantum was measured as a function of the bias current a t a temperature of 28 K. The measured error rates were in good agreeme nt with a model calculation based on thermally activated barrier cross ing. (C) 1998 American Institute of Physics.