P. Kazimierski et H. Lehmberg, ELECTRICAL-CONDUCTIVITY MEASUREMENTS WITH SUBMICROMETER LATERAL RESOLUTION, Surface & coatings technology, 98(1-3), 1998, pp. 939-943
A scanning force microscope (SFM) working in the contact mode and equi
pped with a conducting tip was fully exploited for local electrical co
nductivity imaging. Thin layers of plasma-deposited Ge-C and ferrocene
in a broad range of electrical specific conductivity were investigate
d in detail. The contrast observed in electrical current images was fo
und to be correlated with powders incorporated into the film matrix. A
n attempt was made to detect the structure responsible for electrical
transport. However, the samples appeared to be electrically homogeneou
s down to a scale of 50 nm. (C) 1998 Elsevier Science S.A.