In this work we studied the deposition of Pd on a silicon surface by a
non-conventional plasma assisted deposition technique. The Pd source
is a negatively biased Pd wire located in the deposition chamber and s
puttered by the plasma ions. Emission spectroscopy and Langmuir probe
measurements are used to characterize the plasma and to determine the
experimental parameters influencing the deposit features, especially t
he Pd deposition rate (1-5 ML min(-1)) (ML = monolayer). It has been e
videnced that exact control of the deposited Pd quantity (several ML)
can be performed by adjusting the deposition time duration or the Pd w
ire bias. The Pd films devoted to catalysis applications, exhibit inte
resting characteristic: they are polycrystalline, flat and composed of
small Pd spheres with a diameter of hundreds Angstrom. (C) 1998 Elsev
ier Science S.A.