M. Schiller et W. Kulisch, PLASMA PROPERTIES AT THE TRANSITION FROM REMOTE TO DIRECT PLASMA, Surface & coatings technology, 98(1-3), 1998, pp. 1590-1599
R-PECVD reactors offer many advantages for the deposition of thin film
s. However, high-energy ion bombardment of the substrate can only be a
voided if the plasma parameters pressure and power are carefully chose
n. In order to develop a simple criterion to distinguish remote from d
irect plasmas, nitrogen and argon plasmas at pressures of 0.1-0.5 mbar
and 0.3-0.8 mbar, respectively, have been investigated by a retarding
field energy analyser and Langmuir probes. With increasing power, the
mean ion energy of remote plasmas stays constant up to the remote-dir
ect transition. The sudden increase of the mean ion energy at this poi
nt proved to be a simple criterion to classify a plasma. This criterio
n holds for capacitive as well as inductive coupling. (C) 1998 Elsevie
r Science S.A.