A temperature sensor is described which is compatible with silicon mic
roelectronics and operates over the range 40-150 K. The measurement pr
inciple is based on the analysis of the time decay of the luminescence
emitted by erbium-doped silicon. Experimental results are given as pr
oof of principle. The device could be realized using techniques from s
tandard silicon electronics fabrication processes. (C) 1998 Elsevier S
cience S.A.