A new Monte Carlo model is introduced to describe diffusion-limited ag
gregation (DLA) with extra forces arising from Lorentz's and/or Coulom
b forces. Furthermore, we simulate a behavior of multiparticle diffusi
ve aggregation to examine the resultant pattern of crystal in electroc
hemical deposition. Different patterns grown under various external fo
rces are produced by Monte Carlo simulations. In the present model, th
e basic movement of particles is a random walk, with different transit
ion probabilities in different directions, which characterizes stochas
tically the effect of extra forces. In case of assuming a high magneti
c field, pattern formations which an qualitatively different from the
standard DLA model are observed and they are successfully compared wit
h preexisting experiments (Mogi et al., 1991). The present numerical r
esults of electrochemical deposition show that the generated patterns
strongly depend on the force acting on ions and their concentration (S
awada et al., 1986). Copyright (C) 1998 Elsevier Science B.V.