Dense and smooth thin films can be produced by the deposition of energ
etic clusters onto a solid surface. Roughnes, induced by random deposi
tion of the clusters, is strongly suppressed by a downhill smoothing p
rocess. Molecular dynamic simulations of the impact of copper clusters
onto tilted copper surfaces demonstrate that a downhill particle curr
ent proportional to the local slope of the surface is initiated. In th
e long wavelength limit the evolution of the surface profile is govern
ed by the Edwards-Wilkinson equation. One parameter in this equation i
s related to the strength of the downhill movement due to the cluster
impact and can be determined from the simulations. From the solution o
f the spatially Fourier transformed growth equation the power spectrum
is calculated, which is in agreement with atomic force microscopy mea
surements for copper films. Copyright (C) 1998 Elsevier Science B.V.