SHORT-PERIOD X-RAY MULTILAYERS BASED ON CR SC, W/SC/

Authors
SALASHCHENKO NN FRAERMAN AA MITENIN SV PROKHOROV KA SHAMOV EA
Citation
Nn. Salashchenko et al., SHORT-PERIOD X-RAY MULTILAYERS BASED ON CR SC, W/SC/, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 405(2-3), 1998, pp. 292-296
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
405
Issue
2-3
Year of publication
1998
Pages
292 - 296
Database
ISI
SICI code
0168-9002(1998)405:2-3<292:SXMBOC>2.0.ZU;2-R
Abstract
New experimental results on fabrication and investigations of X-ray pr operties of multilayer X-ray min ors based on Cr/Sc and W/Sc for close -to-normal and Brewster's angles of incidence are presented. It is exp erimentally shown that the peak reflection coefficient of the mirrors Cr/Sc with the periods of 1.6-1.7 nm for the wavelength 3.14 nm reache s 10% at the resolution lambda/Delta lambda up to 175. The reflection coefficient of the mirrors at the Brewster's angle reaches 10-12%. The high reflectivity of the mirrors allows to use them for creation of m ulti-mirror schemes for the X-ray microscopy and astronomy, X-ray diag nostics of high-temperature plasma.