A. Kolmakov et al., X-TRAP INFLUENCE ON LUMINESCENCE AND ELECTRIC PROPERTIES OF C-60 SINGLE-CRYSTAL, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 405(2-3), 1998, pp. 412-417
This paper is devoted to investigation of luminescence and some electr
ic properties of C-60 single crystal and their connection with X-traps
model. Luminescence properties for C-60 single crystal, the temperatu
re dependence of the luminescence spectra and decay kinetics were meas
ured for wide range of excitation energies. At low temperatures the em
ission spectra with well resolved structure were detected. Opposite to
the case of C-60 films, the single crystal shape of the luminescence
spectra also change with temperature. This behavior can be described i
n terms of X-trap model as proposed in [1]. The luminescence kinetics
under 36 eV excitation as a function of temperature was investigated i
n nanosecond range. At temperature T < 300 K, the decay curve is non-e
xponential and it can be fitted formally by two exponents with charact
eristic times in the 1-100 ns range. We suppose the explanation of thi
s relaxation behavior requires more particular information about elect
ron-hole recombination dynamics which can be affected by X-traps. Foll
owing X-traps concept we present preliminary results of thermostimulat
ed currents spectroscopy experiments. It reveals the availability of t
wo thermorelaxation processes in C-60 single crystal and therefore ind
eed the presence at least of two types of traps for charges in this cr
ystals.