CRITICAL PARAMETERS FOR ELECTRICAL TREE FORMATION IN XLPE

Citation
G. Jiang et al., CRITICAL PARAMETERS FOR ELECTRICAL TREE FORMATION IN XLPE, IEEE transactions on power delivery, 13(2), 1998, pp. 292-296
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
08858977
Volume
13
Issue
2
Year of publication
1998
Pages
292 - 296
Database
ISI
SICI code
0885-8977(1998)13:2<292:CPFETF>2.0.ZU;2-9
Abstract
Published data for electrical tree inception field at a defect in XLPE vs. the Laplacian field at the tip of the defect are explained on the basis of a minimum distance which the space charged limited field mus t extend from the defect tip into the XLPE in order to damage enough d ielectric in the field direction to facilitate PD inception and tree i nitiation.