A VERSATILE STABLE SCANNING PROXIMAL PROBE MICROSCOPE

We present a novel scanning proximal probe microscope design utilizing a piezoelectric driven coarse positioning mechanism in x, y, and z, w hile maintaining relatively small lateral dimensions. The instrument i s suitable for insertion into a Dewar. The primary purpose of this wor k is to develop a stable yet versatile instrument in order to meet the signal averaging limitations imposed by low signal level measurements . We have implemented a near field scanning optical microscope with th is system, whose key features include simultaneous detection of reflec ted and transmitted signals, unique ''center of mass'' tip oscillator for shear force feedback, and overall microscope stability. (C) 1997 A merican Institute of Physics.