STRAIN-INDUCED BIREFRINGENCE IN VERTICAL-CAVITY SEMICONDUCTOR-LASERS

Citation
Akj. Vandoorn et al., STRAIN-INDUCED BIREFRINGENCE IN VERTICAL-CAVITY SEMICONDUCTOR-LASERS, IEEE journal of quantum electronics, 34(4), 1998, pp. 700-706
Citations number
33
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189197
Volume
34
Issue
4
Year of publication
1998
Pages
700 - 706
Database
ISI
SICI code
0018-9197(1998)34:4<700:SBIVS>2.0.ZU;2-J
Abstract
We describe a new technique to study and control the polarization prop erties of planar vertical-cavity semiconductor lasers, The technique c onsists of the application of a controllable amount of strain by means of the thermal expansion that results from local heating in the vicin ity of the device, Analytical expressions are derived for the strain a nd birefringence induced with this hot-spot technique, Experimentally, the relation between strain and birefringence is found to be highly a nisotropic; this allows a natural interpretation of the distribution o f the native polarization angles.