ELECTROMIGRATION WREAKS HAVOC ON IC DESIGN

Authors
LLOYD J OVERHAUSER D
Citation
J. Lloyd et D. Overhauser, ELECTROMIGRATION WREAKS HAVOC ON IC DESIGN, EDN, 43(7), 1998, pp. 145-148
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
EDN → ACNP
ISSN journal
00127515
Volume
43
Issue
7
Year of publication
1998
Pages
145 - 148
Database
ISI
SICI code
0012-7515(1998)43:7<145:EWHOID>2.0.ZU;2-0
Abstract
Current IC-design practices make perfect conditions for electromigrati on, which causes broken connections. A thorough understanding of the p roblem and its prevention help prolong and IC's life.