Focusing light through an interface leads to an aberrated intensity di
stribution that is highly extended with a relatively low peak intensit
y. We present a method, using a well-chosen annular aperture, that can
greatly improve the localization of the intensity about a prescribed
point on the axis. Also, the intensity at that point can be increased
significantly. By continuously varying the annulus radii, we can scan
the intensity peak through the second medium. This localization and sc
anning method has possible applications in three-dimensional imaging a
nd lithography. (C) 1998 Optical Society of America.