XPS AND XRD STUDY OF THE ELECTROCHROMIC MECHANISM OF WOX FILMS

XPS, XRD and other techniques were used to study the phase, compositio n and valence states of W and O ions of electrochromic (EC) WOx films prepared by DC magnetron reactive sputtering. The XRD results indicate that different EC WOx films consist of different phases and compositi ons. XPS results reveal that W6+, W5+ and W4+ ions coexist in colored WOx films, but only W6+ ions are detected in bleached WOx films. The b inding energy and the relative content of the O Is peaks of WOx films are very different for the bleached and colored states. (C) 1998 Elsev ier Science S.A.