Ad. Pogrebnjak et al., MIXING OF TA-FE AND MO-FE SYSTEMS USING A LOW-ENERGY, HIGH-CURRENT ELECTRON-BEAM, Surface & coatings technology, 99(1-2), 1998, pp. 98-110
Rutherford backscattering spectroscopy, Auger electron spectroscopy, c
onversion electron Mossbauer spectroscopy, transmission microscopy and
scanning electron microscopy showed that treatment of a thin Ta or Mo
film/alpha-Fe substrate system with a high-current electron beam (HCE
B) of an energy density of 2.3-5.2 J cm(-2) resulted in a mixing of th
e system's components. In the energy range 2.3-3.3 J cm(-2) in the HCE
B-irradiated Ta-Fe system, we found a mixed layer of a thickness of ab
out 100 nm, which we relate to the formation of a stable compound (Fe2
Ta, FeTa) and a non-equilibrium Fe5Ta2, compound. The irradiated surfa
ce is not uniform, being composed of Ta inclusions of a spherical form
(300 nm diameter), solid-solution Fe(Ta) and amorphous-phase Fe-Ta. A
n increase in the pulse number results in the formation of the volume
fraction FeTa and a dislocation density of 5 x 10(10) cm(-2). It has b
een shown that HCEB irradiation of the Mo-Fe system with energy flow d
ensities of 2.3-3.3 J cm(-2) produced a mixed layer of a thickness of
up to 150 nm, and a non-equilibrium Fe4Mo compound (Fe80Mo20) was form
ed. On increasing the energy density to 4.2 J cm(-2), we observed part
ial Mo ablation and the formation of a mixed compound with a Mo concen
tration of several at.%. (C) 1998 Elsevier Science S.A.