It is shown that in low-temperature plasma devices with pulsed externa
l current circuits such as thermal emission converters and plasma diod
es, the only forces inducing plasma flows are due to the temperature s
tresses on ions. These flows are similar to the plasma ''residual'' ro
tations in tokamaks. However, they are connected with the perpendicula
r viscosity dependence of the ion heat fluxes, contrary to tokamaks wh
ere parallel viscosity plays the main role. Dust contamination of thes
e devices can induce temperature-gradient driven flows of ions, which
also entrain neutrals in a multi-component partially ionized plasma. (
C) 1998 Elsevier Science B.V.