PHOTOVOLTAGE PROPERTIES OF SEMICONDUCTOR LB FILMS ON N-SI SUBSTRATE IN CONTACT WITH METAL-ELECTRODE

Citation
A. Komolov et al., PHOTOVOLTAGE PROPERTIES OF SEMICONDUCTOR LB FILMS ON N-SI SUBSTRATE IN CONTACT WITH METAL-ELECTRODE, Thin solid films, 311(1-2), 1997, pp. 259-261
Citations number
10
Journal title
ISSN journal
00406090
Volume
311
Issue
1-2
Year of publication
1997
Pages
259 - 261
Database
ISI
SICI code
0040-6090(1997)311:1-2<259:PPOSLF>2.0.ZU;2-K
Abstract
Photovoltage properties of multilayer Langmuir-Blodgett (LB) films of corbathiene (similar to 100 nm thick) on the n-Si substrate with semit ransparent top gold electrode have been investigated. Measurements of photovoltage dependence on wavelength and intensity of exciting light have been performed. The photovoltage values attaining 0.4 V are well reproducible when subjected to illumination of intensity up to 10(14) photons cm(-2) s(-1) in the wavelength range 300-900 nm. The results a re related to the major role of the film/substrate interface and to th e films optical absorption features. (C) 1997 Elsevier Science S.A.