PROPERTIES OF SPUTTERED THIN-FILMS OF VANADIUM TITANIUM-OXIDE FOR USEIN ELECTROCHROMIC WINDOWS

Authors
Citation
Ms. Burdis, PROPERTIES OF SPUTTERED THIN-FILMS OF VANADIUM TITANIUM-OXIDE FOR USEIN ELECTROCHROMIC WINDOWS, Thin solid films, 311(1-2), 1997, pp. 286-298
Citations number
18
Journal title
ISSN journal
00406090
Volume
311
Issue
1-2
Year of publication
1997
Pages
286 - 298
Database
ISI
SICI code
0040-6090(1997)311:1-2<286:POSTOV>2.0.ZU;2-X
Abstract
Thin films of various compositions of VzTi1-zOy have been deposited by RF-diode sputtering. A variety of optical and electrochemical measure ments have been carried out to determine their suitability to perform as counter electrodes (CE) in electrochromic windows. It has been foun d that in general, the films containing higher vanadium concentrations have higher charge capacities, which are seen to be easily sufficient to make useful CE layers in electrochromic windows. The electrochromi c behaviour of the VzTi1-zOy films themselves is seen to be quite comp licated, and does not fit a first order theory. A simple theoretical m odel based on electrons being localised preferentially on vanadium ato ms is given, which goes some way towards explaining this behaviour. (C ) 1997 Elsevier Science S.A.