OPTICAL CHARACTERIZATION OF TITANIA THIN-FILMS PRODUCED BY THE SOLGELMETHOD AND DOPED WITH CO2+ AT DIFFERENT CONCENTRATIONS

We report some preliminary results on the fabrication and optical char acterization of high-refractive-index thin films of titania doped with Co2+ These films were supported on silica plates that were chemically activated to attach both phases. The titania films were produced by t he solgel method at room temperature and slowly annealed from room tem perature to 230 degrees C; their thickness was approximately 600 Angst rom. The optical characterizations were obtained by the use of spectro scopic ellipsometry, where the dielectric function of the material was obtained as a function of the wavelength. Additionally, the ellipsome tric function was modeled to obtain the porosity of the films and thei r thickness. (C) 1998 Optical Society of America.