W C, W/TI, NI/TI, AND NI/V MULTILAYERS FOR THE SOFT-X-RAY RANGE - EXPERIMENTAL INVESTIGATION WITH SYNCHROTRON-RADIATION/

Citation
Hc. Mertins et al., W C, W/TI, NI/TI, AND NI/V MULTILAYERS FOR THE SOFT-X-RAY RANGE - EXPERIMENTAL INVESTIGATION WITH SYNCHROTRON-RADIATION/, Applied optics, 37(10), 1998, pp. 1873-1882
Citations number
33
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
37
Issue
10
Year of publication
1998
Pages
1873 - 1882
Database
ISI
SICI code
0003-6935(1998)37:10<1873:WCWNAN>2.0.ZU;2-M
Abstract
An experimental investigation of W/C, W/Ti, Ni/Ti, and Ni/V multilayer s is presented that uses synchrotron radiation in the soft-x-ray energ y region between 100 and 1500 eV with special emphasis on the water wi ndow. The multilayers were designed as normal incidence reflectors and for polarimetry purposes around the Brewster angle. Both reflection a nd transmission multilayers were prepared for use as linear polarizers and phase retarders, respectively, to produce or analyze circularly p olarized light. Their period was optimized to achieve maximum reflecta nce at the 1s absorption edge of C (284 eV) and the 2p edges of a (454 eV) and V (512 eV), respectively. At these edges the multilayers show an enhancement of reflectance and energy resolution that is in accord ance with theoretical calculations. (C) 1998 Optical Society of Americ a.