CORRELATION BETWEEN ATOMIC-STRUCTURE AND LOCALIZED GAP STATES IN SILICON GRAIN-BOUNDARIES

Citation
F. Cleri et al., CORRELATION BETWEEN ATOMIC-STRUCTURE AND LOCALIZED GAP STATES IN SILICON GRAIN-BOUNDARIES, Physical review. B, Condensed matter, 57(11), 1998, pp. 6247-6250
Citations number
23
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
11
Year of publication
1998
Pages
6247 - 6250
Database
ISI
SICI code
0163-1829(1998)57:11<6247:CBAALG>2.0.ZU;2-Z
Abstract
Tight-binding molecular-dynamics simulations of a typical high-energy grain boundary in silicon show that its equilibrium atomic structure i s similar to that of bulk amorphous silicon and contains coordination defects. The corresponding electronic structure is also amorphouslike, displaying gap states mainly localized around the coordination defect s, where large changes in the bond-hybridization character are observe d. It is proposed that such coordination defects in disordered high-en ergy grain boundaries are responsible for the experimentally observed gap states in polycrystalline Si.