C-60 GE(100)-(2X1) INTERFACIAL STRUCTURE

Citation
Rd. Aburano et al., C-60 GE(100)-(2X1) INTERFACIAL STRUCTURE, Physical review. B, Condensed matter, 57(11), 1998, pp. 6636-6641
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
11
Year of publication
1998
Pages
6636 - 6641
Database
ISI
SICI code
0163-1829(1998)57:11<6636:CGIS>2.0.ZU;2-R
Abstract
A room-temperature-deposited C-60 film on a Ge(100)-(2x1) surface reta ins the clean-surface (2x1) dimers at the interface. This is revealed by Patterson analysis of synchrotron x-ray-diffraction measurements of numerous in-plane fractional-order diffraction spots. The result sugg ests a mild interaction between the room-temperature-deposited film an d the substrate surface reconstruction. The C-60 film shows a (111) gr owth direction, and its [11(2) over bar] azimuth is oriented parallel to the {062} directions of the substrate. The result is a domain struc ture consistent with the threefold symmetry of the (111) growth direct ion and the two-domain, twofold symmetry of the substrate surface.