A room-temperature-deposited C-60 film on a Ge(100)-(2x1) surface reta
ins the clean-surface (2x1) dimers at the interface. This is revealed
by Patterson analysis of synchrotron x-ray-diffraction measurements of
numerous in-plane fractional-order diffraction spots. The result sugg
ests a mild interaction between the room-temperature-deposited film an
d the substrate surface reconstruction. The C-60 film shows a (111) gr
owth direction, and its [11(2) over bar] azimuth is oriented parallel
to the {062} directions of the substrate. The result is a domain struc
ture consistent with the threefold symmetry of the (111) growth direct
ion and the two-domain, twofold symmetry of the substrate surface.