V. Cambel et al., CHARACTERIZATION OF INGAAS INP MICROSCOPIC HALL PROBE ARRAYS WITH A 2DEG ACTIVE LAYER/, Materials science & engineering. B, Solid-state materials for advanced technology, 51(1-3), 1998, pp. 188-191
Highly-sensitive cryogenic microscopic Hall probe arrays based on an e
pitaxial InGaAs/InP heterostructure with a two-dimensional electron ga
s (2DEG) were prepared and characterised in high magnetic fields at 0.
3 K. A model of the heterostructure including a self-consistent descri
ption of coupled Poisson and Schrodinger equations was solved to optim
ise its design. Test arrays exhibit a constant 2DEG concentration at 4
.2-100 K, which gives a temperature coefficient lower than 100 ppm deg
rees C-1. The magnetic sensitivity is greater than or equal to 1250 VA
(-1)T(-1). Quantum oscillations in the 2DEG structure in high magnetic
fields at temperatures below 4.2 K can be suppressed by increasing bi
as current supplied to the arrays respecting their dimensions. Noise c
haracteristics at 300 K are also presented. (C) 1998 Elsevier Science
S.A. All rights reserved.