ULTRASMOOTH V-GROOVES IN INP BY 2-STEP WET CHEMICAL ETCHING

Citation
P. Bonsch et al., ULTRASMOOTH V-GROOVES IN INP BY 2-STEP WET CHEMICAL ETCHING, Journal of the Electrochemical Society, 145(4), 1998, pp. 1273-1276
Citations number
15
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
ISSN journal
00134651
Volume
145
Issue
4
Year of publication
1998
Pages
1273 - 1276
Database
ISI
SICI code
0013-4651(1998)145:4<1273:UVIIB2>2.0.ZU;2-E
Abstract
A two-step wet chemical etching process using HBr and HBr:K2Cr2O7 was developed in order to fabricate high-quality V-grooves in InP (100) wa fers. A 40 nm titanium film, which was patterned by conventional photo lithography and liftoff, was used as the etching mask. The {111}A side walls are mirrorlike with an arithmetic average roughness of less than 0.4 nm. The tip radius of the V-grooves is approximately 7 nm. Both v alues were determined by atomic force microscopy.