A two-step wet chemical etching process using HBr and HBr:K2Cr2O7 was
developed in order to fabricate high-quality V-grooves in InP (100) wa
fers. A 40 nm titanium film, which was patterned by conventional photo
lithography and liftoff, was used as the etching mask. The {111}A side
walls are mirrorlike with an arithmetic average roughness of less than
0.4 nm. The tip radius of the V-grooves is approximately 7 nm. Both v
alues were determined by atomic force microscopy.