In this paper we report new experimental results with the scanning tun
neling atom probe (STAP), a new instrument that combines the functions
of a scanning tunneling microscope (STM) and a time-of-flight atom pr
obe. In STM-mode, clusters of atoms are transferred from regions of in
terest to the tip, from which they are ejected into a time-of-flight s
pectrometer for species identification. Improvements to the instrument
and experimental results with in situ grown germanium layers on Si(11
1)-(7 x 7) are shown. Problems with the atom transfer and possible rem
edies are discussed. (C) 1998 Elsevier Science B.V.