ANALYSIS OF 3-DIMENSIONAL SIMS IMAGES USING IMAGE CROSS-CORRELATION SPECTROSCOPY

Citation
M. Srivastava et al., ANALYSIS OF 3-DIMENSIONAL SIMS IMAGES USING IMAGE CROSS-CORRELATION SPECTROSCOPY, Surface and interface analysis, 26(3), 1998, pp. 188-194
Citations number
13
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
3
Year of publication
1998
Pages
188 - 194
Database
ISI
SICI code
0142-2421(1998)26:3<188:AO3SIU>2.0.ZU;2-J
Abstract
Three-dimensional (3D) SIMS images of secondary ion distributions in a solid volume can be produced from om a stack of individual images acq uired sequentially at different depths during depth profiling of the s olid. While it is often passible to obtain visual correlations of larg e-scale features that occur in several images in the stack, the correl ation of less-obvious features requires a more mathematical approach, We present here two cases where image cross-correlation spectroscopy ( ICCS) can be used to clarify the presence or absence of organized stru cture ia a 3D depth profile. In one example, the images of deuterium d istribution in a zirconium oxide thin film were confirmed to exhibit o rder over a series of images, thereby suggesting the existence of cont inuous pores in the material. In a second example, the apparent cluste ring of gold distributions in a 3D profile of an arsenopyrite mineral was shown to be uncorrelated and likely an artefact of data collection . (C) 1998 John Wiley & Sans, Ltd.