M. Srivastava et al., ANALYSIS OF 3-DIMENSIONAL SIMS IMAGES USING IMAGE CROSS-CORRELATION SPECTROSCOPY, Surface and interface analysis, 26(3), 1998, pp. 188-194
Three-dimensional (3D) SIMS images of secondary ion distributions in a
solid volume can be produced from om a stack of individual images acq
uired sequentially at different depths during depth profiling of the s
olid. While it is often passible to obtain visual correlations of larg
e-scale features that occur in several images in the stack, the correl
ation of less-obvious features requires a more mathematical approach,
We present here two cases where image cross-correlation spectroscopy (
ICCS) can be used to clarify the presence or absence of organized stru
cture ia a 3D depth profile. In one example, the images of deuterium d
istribution in a zirconium oxide thin film were confirmed to exhibit o
rder over a series of images, thereby suggesting the existence of cont
inuous pores in the material. In a second example, the apparent cluste
ring of gold distributions in a 3D profile of an arsenopyrite mineral
was shown to be uncorrelated and likely an artefact of data collection
. (C) 1998 John Wiley & Sans, Ltd.