RESOLUTION ENHANCEMENT OF X-RAY PHOTOELECTRON-SPECTRA BY MAXIMUM-ENTROPY DECONVOLUTION

Citation
Sj. Splinter et Ns. Mcintyre, RESOLUTION ENHANCEMENT OF X-RAY PHOTOELECTRON-SPECTRA BY MAXIMUM-ENTROPY DECONVOLUTION, Surface and interface analysis, 26(3), 1998, pp. 195-203
Citations number
60
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
3
Year of publication
1998
Pages
195 - 203
Database
ISI
SICI code
0142-2421(1998)26:3<195:REOXPB>2.0.ZU;2-9
Abstract
The maximum entropy method (MEM) is applied to the deconvolution of x- ray photoelectron spectra. This method provides the least-biased estim ate of the unbroadened spectrum by using the Shannon information conte nt as the regularizing functional. The large-scale, non-linear optimiz ation problem is solved using a robust variable metric sequential-quad ratic programming (SQP) algorithm implemented on a personal computer ( PC). The program is tested on simulated spectra and then shown to prov ide reliable resolution enhancement of measured spectra by unfolding a measured instrumental resolution function. Typical resolution enhance ments of 50% are achievable in <15 min of computer time. (C) 1998 John Wiley & Sons, Ltd.