SOME ASPECTS OF THE FITTING OF XPS CORE SPECTRA OF POLYMERS

Citation
S. Mahl et al., SOME ASPECTS OF THE FITTING OF XPS CORE SPECTRA OF POLYMERS, Surface and interface analysis, 26(3), 1998, pp. 204-212
Citations number
44
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
3
Year of publication
1998
Pages
204 - 212
Database
ISI
SICI code
0142-2421(1998)26:3<204:SAOTFO>2.0.ZU;2-U
Abstract
Determination of chemical structure by means of XPS through least-squa res fitting of core lines is a widely used method. We present a model for the description of XPS core lines from polymers under simultaneous consideration of the lineshape and the inelastic background. For prop er consideration of the background, a model loss function with free pa rameters was included in the fitting process. The free parameters of t he model can be found by least-squares fitting. Using this procedure, XPS core lines of many polymers can be described over a range of 25 eV , which will be demonstrated for selected polymers (PcI, PGMA, PVMK, P PG, PVME, PAA, PE). The model could be easily modified to fit other cl asses of materials. It will be shown how statistical analysis of the d ata can be used to evaluate the fitting results. (C) 1998 John Wiley & Sons, Ltd.