TOTAL CROSS-SECTION MEASUREMENTS FOR ELECTRON-SCATTERING ON SILICON TETRAFLUORIDE

Authors
KARWASZ GP BRUSA RS PIAZZA A ZECCA A MOZEJKO P KASPERSKI G SZMYTKOWSKI C
Citation
Gp. Karwasz et al., TOTAL CROSS-SECTION MEASUREMENTS FOR ELECTRON-SCATTERING ON SILICON TETRAFLUORIDE, Chemical physics letters, 284(1-2), 1998, pp. 128-134
Citations number
38
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
Journal title
Chemical physics letters → ACNP
ISSN journal
00092614
Volume
284
Issue
1-2
Year of publication
1998
Pages
128 - 134
Database
ISI
SICI code
0009-2614(1998)284:1-2<128:TCMFEO>2.0.ZU;2-B
Abstract
Total cross sections for electron scattering on SiF4 have been measure d between 0.6 and 3500 eV. An absolute transmission method has been us ed on two different apparatuses. Evidence for a Ramsauer minimum is fo und at about 1 eV collision energy. A discussion is given of possible resonant states at low energies. (C) 1998 Published by Elsevier Scienc e B.V.