The photo-induced conversion of polyamic acid spun onto Si and quartz
substrates into thin polyimide films at low temperature using 172 nm r
adiation from a Xe-2 excimer lamp is described. The degree of imidiza
tion of the polyimide films during the UV curing at different exposure
times and temperatures was investigated using Fourier transform infra
red spectroscopy. Compared with conventional furnace processing, the p
hoto-induced curing of the polyimide provided both reduced processing
time and temperature. Ellipsometry, UV spectrophotometry. capacitance-
voltage and current-voltage measurements were employed to characterize
the polymer films and indicated them to be of high quality. In partic
ular, the current-voltage measurements showed that the leakage current
density of the irradiated polymer was over an order of magnitude smal
ler than has been obtained in layers prepared by thermal processing. (
C) 1998 Elsevier Science B.V.