Pk. Wei et Ws. Fann, THE PROBE DYNAMICS UNDER SHEAR FORCE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Journal of applied physics, 83(7), 1998, pp. 3461-3468
We present here the results of theoretical as well as experimental stu
dies of shear force interactions in near-field scanning optical micros
copy. A continuum mechanical model that considers the realistic tapere
d fiber shape was used to calculate the shea force during the interact
ions. The frequency spectra at different probe/sample separations show
that the shear force is a combination of elastic and frictional force
. The relative strengths of these two forces depend on the tilt angle
between the probe and the sample surface. (C) 1998 American Institute
of Physics. [S0021-8979(98)08806-9].