THE PROBE DYNAMICS UNDER SHEAR FORCE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Authors
Citation
Pk. Wei et Ws. Fann, THE PROBE DYNAMICS UNDER SHEAR FORCE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Journal of applied physics, 83(7), 1998, pp. 3461-3468
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
7
Year of publication
1998
Pages
3461 - 3468
Database
ISI
SICI code
0021-8979(1998)83:7<3461:TPDUSF>2.0.ZU;2-Y
Abstract
We present here the results of theoretical as well as experimental stu dies of shear force interactions in near-field scanning optical micros copy. A continuum mechanical model that considers the realistic tapere d fiber shape was used to calculate the shea force during the interact ions. The frequency spectra at different probe/sample separations show that the shear force is a combination of elastic and frictional force . The relative strengths of these two forces depend on the tilt angle between the probe and the sample surface. (C) 1998 American Institute of Physics. [S0021-8979(98)08806-9].