THERMAL INVESTIGATIONS OF ICS AND MICROSTRUCTURES II

Authors
SZEKELY V RENCZ M COURTOIS B
Citation
V. Szekely et al., THERMAL INVESTIGATIONS OF ICS AND MICROSTRUCTURES II, Microelectronics, 29(4-5), 1998, pp. 159-162
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics → ACNP
ISSN journal
00262692
Volume
29
Issue
4-5
Year of publication
1998
Pages
159 - 162
Database
ISI
SICI code
0026-2692(1998)29:4-5<159:TIOIAM>2.0.ZU;2-U