THERMAL-RESISTANCE MEASUREMENT PROTOCOLS

Citation
M. Oflaherty et al., THERMAL-RESISTANCE MEASUREMENT PROTOCOLS, Microelectronics, 29(4-5), 1998, pp. 199-208
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00262692
Volume
29
Issue
4-5
Year of publication
1998
Pages
199 - 208
Database
ISI
SICI code
0026-2692(1998)29:4-5<199:TMP>2.0.ZU;2-M
Abstract
Thermal data supplied by manufacturers and used as a benchmark in a co mparison of the thermal performance of different packages must be trea ted with caution, as the results are specific to the measurement envir onment of the supplier. For this reason, calculations of expected comp onent thermal performance based on these data can be erroneous. This p aper is an analysis of the discrepancies observed in thermal test resu lts owing to small changes in the exact implementation of the measurem ents and in the calibration of the device temperature-sensitive parame ter (diode V-f). It concludes with recommendations for ensuring more a ccurate and reproducible thermal resistance measurements. (C) 1998 Pub lished by Elsevier Science Ltd. All rights reserved.