USE OF TC-99M AS AN ENERGY STANDARD FOR ELECTRON-SPECTROSCOPY - PROMISE AND LIMITATIONS

An electrostatic spectrometer was used to study the dependence of the position of the (M) under bar(5) line of conversion electrons front th e 2.17-keV transition in Tc-99 on the source thickness, in samples of different chemical compounds of Tc: metallic technetium, technetium di oxide, and pertechnate. Recommendations are given concerning the use o f a source in the form of a film of metallic technetium (less than 10( -7) g/cm(2) thick) on a platinum substrate for calibrating electron sp ectrometers in the energy range of a few kiloelectron volts. A procedu re is described for preparing films of metallic technetium.