Epitaxial Pb(ZrxTi1-x)O-3 (PZT) thin films have been grown by pulsed l
aser deposition and structurally characterized using theta-2 theta and
phi-scan x-ray diffraction, RHEED and ECP. Epitaxial relations with (
100)SrTio(3) substrates have been demonstrated. The refractive indexes
, measured by ellipsometry, are reported in relation with the film sto
ichiometry. Heteroepitaxial growth of PZT/YBCO and YBCO/PZT bilayers (
YBCO = YBa2Cu3O7) has been achieved.