A HIGH-RESOLUTION MEASUREMENT SYSTEM FOR SURFACE PROFILE OF ELECTRIC CONTACT

Authors
EBARA Y SONE H NEMOTO Y TAKAGI T
Citation
Y. Ebara et al., A HIGH-RESOLUTION MEASUREMENT SYSTEM FOR SURFACE PROFILE OF ELECTRIC CONTACT, IEICE transactions on electronics, E81C(3), 1998, pp. 432-434
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEICE transactions on electronics → ACNP
ISSN journal
09168524
Volume
E81C
Issue
3
Year of publication
1998
Pages
432 - 434
Database
ISI
SICI code
0916-8524(1998)E81C:3<432:AHMSFS>2.0.ZU;2-E
Abstract
We discussed on relationship between the width of slit ray and the acc uracy of the measurement system for surface profile of electric contac t. To obtain resolution of 10[mu m], we designed the mechanism which k eeps constant the focal length between the object and the lens. As a r esult, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.