A. Das et al., PHYSICAL AND CHEMICAL IMPLICATIONS OF 100 KEV H-ABLATED PPS THIN-FILMS( IMPLANTATION OF LASER), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 134(3-4), 1998, pp. 377-384
Citations number
29
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical
Structural and chemical investigation for the laser ablated Poly (Phen
ylene Sulfide) (PPS) films upon 100 keV H+ implantation is reported he
re for the first time. PPS thin films were fabricated by laser ablatio
n with a Nd:YAG laser as a source of visible photons (532 nm). The las
er ablated thin films showed strong polymer breakdown resistance upto
a total fluence of 10(15) ions/cm(2). Bulk properties of the as-deposi
ted and the implanted samples were investigated using FTIR and UV-VIS
spectroscopy. Drastic reduction in the intensity of all characteristic
vibrational frequencies in the FTIR spectrum at higher doses revealed
the transformation of the polymer to a conjugated carbonaceous materi
al. UV-VIS studies showed a positive shift in the absorption edge valu
e for the as-deposited polymer towards higher wavelengths and destruct
ion of phenyl ring due to the H+ bombardment. X-ray Photoelectron Spec
troscopic (:XPS) investigation indicated the sulfur depletion as a pro
minent phenomenon whereas carbon content remained almost the same. XPS
studies of the implanted sample also revealed a minor change in the o
xidized species of carbon and more prominent change in oxidized specie
s of sulfur which were present in the as-deposited samples. A peak at
283.4 eV attributed to 'surface reconstruction' in the XPS analysis fo
r the as-deposited PPS film disappeared after proton implantation. (C)
1998 Elsevier Science B.V.