RECENT RESULTS AND FUTURE CHALLENGES FOR THE NIST CHARGED-CAPACITOR EXPERIMENT

Citation
Nm. Zimmerman et al., RECENT RESULTS AND FUTURE CHALLENGES FOR THE NIST CHARGED-CAPACITOR EXPERIMENT, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 294-298
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
46
Issue
2
Year of publication
1997
Pages
294 - 298
Database
ISI
SICI code
0018-9456(1997)46:2<294:RRAFCF>2.0.ZU;2-R
Abstract
This paper reports on recent results in some of the work toward develo ping a new capacitance standard using single electron tunneling (SET) devices, In particular, we plan on using a SET pump to charge a cryoge nic standard capacitor and measure the voltage that develops, In this paper, we summarize: 1) measurements of the ratio of two capacitors in a bridge configuration, using a SET transistor as the null detector a nd 2) stability and leakage measurements on the cryogenic capacitors, We then discuss in detail several of the possible challenges, includin g the effects of stray capacitance and line impedance, and resulting r equirements on the sensitivity of the SET null detector.