Nm. Zimmerman et al., RECENT RESULTS AND FUTURE CHALLENGES FOR THE NIST CHARGED-CAPACITOR EXPERIMENT, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 294-298
This paper reports on recent results in some of the work toward develo
ping a new capacitance standard using single electron tunneling (SET)
devices, In particular, we plan on using a SET pump to charge a cryoge
nic standard capacitor and measure the voltage that develops, In this
paper, we summarize: 1) measurements of the ratio of two capacitors in
a bridge configuration, using a SET transistor as the null detector a
nd 2) stability and leakage measurements on the cryogenic capacitors,
We then discuss in detail several of the possible challenges, includin
g the effects of stray capacitance and line impedance, and resulting r
equirements on the sensitivity of the SET null detector.