LOADING EFFECTS IN RESISTANCE SCALING

Citation
Re. Elmquist et Rf. Dziuba, LOADING EFFECTS IN RESISTANCE SCALING, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 322-324
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
46
Issue
2
Year of publication
1997
Pages
322 - 324
Database
ISI
SICI code
0018-9456(1997)46:2<322:LEIRS>2.0.ZU;2-6
Abstract
Reference resistors are affected by the heating of the resistor elemen t caused by the measurement current. The effects of such loading are c omplex and can change in magnitude as a function of the initial state of the resistor and the external environment. This paper describes a m ethod for determining relative load coefficients by using cryogenic cu rrent comparator ratio measurements in a two-step scaling process. Pre viously undiscovered loading effects are analyzed using a resistance e lement made from copper, which has an easily measured change of resist ance with temperature. The magnitude of loading effects in several typ es of resistors are listed.