M. Osterhold, INFLUENCE OF SUBSTRATE STRUCTURE ON COATING APPEARANCE AND THE RELEVANT CHARACTERIZATION METHODS, Materialwissenschaft und Werkstofftechnik, 29(3), 1998, pp. 131-136
In this paper the relevant mechanical and optical measuring methods (m
ech. profilometry, wave-scan, Autospect) for studying the surface stru
cture of painted and unpainted samples will be presented. The various
methods were discussed and compared in the first part of the paper, wh
ile in a second part an example concerning the influence of substrate
roughness and baking position on the final topcoat structure will be g
iven. A third pan presents a study on deformend and undeformed substra
tes of different sheet type and the effect on topcoat appearance. In a
ddition, a comparison of two paint systems will be shown.