PRECISION VOLUME MEASUREMENTS ON SILICON SPHERES

Citation
A. Sacconi et al., PRECISION VOLUME MEASUREMENTS ON SILICON SPHERES, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 584-587
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
46
Issue
2
Year of publication
1997
Pages
584 - 587
Database
ISI
SICI code
0018-9456(1997)46:2<584:PVMOSS>2.0.ZU;2-Y
Abstract
In the determination of the Avogadro constant N-A, use is made of sili con spheres as volume-density standards, where volume measurements pla y a critical role, After various changes in the experimental apparatus and in the measurement procedure. neu volume measurements have been m ade on the two IMGC spherical standards, Present results are confirmin g the 1994 results within 0.15x10(-6) in volume, Preliminary data are also presented on the thermal expansivity of four silicon spheres, The average linear coefficient of thermal expansion at 20 degrees C is al pha = 2.567 x 10(-6) /K-1, with a sphere-to-sphere variability of up t o 2.5 x 10(-8)/K-1.