We report experimental results that show that the far-field correlatio
n function is sensitive to a small local change in rough-surface geome
try, where the speckle spatial correlation rather than the sample ense
mble average is adopted. The angular cross-correlation function of the
far-field speckles scattered by one-dimensional random rough surfaces
is measured when a polarized beam of light is incident upon the rough
surface from vacuum, where one part of the surface used is a thin die
lectric film deposited upon a glass substrate and the other part is id
entical to the first except for a localized defect. We envisage applic
ation of this sensitivity property to inspection of a sample with a de
fect by means of speckle mapping. (C) 1998 Optical Society of America.